Article Versions Notes

Meyer S, Wolf A, Sanders D, Iskhakova K, Ćwieka H, Bruns S, Flenner S, Greving I, Hagemann J, Willumeit-Römer R, et al. Degradation Analysis of Thin Mg-xAg Wires Using X-ray Near-Field Holotomography. Metals. 2021; 11(9):1422. https://doi.org/10.3390/met11091422

Meyer, Sebastian, Andreas Wolf, Daniela Sanders, Kamila Iskhakova, Hanna Ćwieka, Stefan Bruns, Silja Flenner, Imke Greving, Johannes Hagemann, Regine Willumeit-Römer, and et al. 2021. "Degradation Analysis of Thin Mg-xAg Wires Using X-ray Near-Field Holotomography" Metals 11, no. 9: 1422. https://doi.org/10.3390/met11091422

Meyer, S., Wolf, A., Sanders, D., Iskhakova, K., Ćwieka, H., Bruns, S., Flenner, S., Greving, I., Hagemann, J., Willumeit-Römer, R., Wiese, B., & Zeller-Plumhoff, B. (2021). Degradation Analysis of Thin Mg-xAg Wires Using X-ray Near-Field Holotomography. Metals, 11(9), 1422. https://doi.org/10.3390/met11091422