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Article

Development and Characterization of Synthetic Hexaploid Wheat for Improving the Resistance of Common Wheat to Leaf Rust and Heat Stress

1
Department of Plant Biotechnology, College of Life Sciences and Biotechnology, Korea University, Anam-dong 5-ga, Seongbuk-gu, Seoul 02841, Korea
2
Institute of Life Science and Natural Resources, Korea University, Seoul 02841, Korea
3
Global Wheat Program, International Maize and Wheat Improvement Center, Carretera México-Veracruz Km. 45, El Batán, Texcoco C.P. 56237, Mexico
4
Department of Molecular Biotechnology, College of Agriculture and Life Sciences, Bioenergy Research Center, Chonnam National University, Gwangju 61186, Korea
*
Authors to whom correspondence should be addressed.
Agronomy 2021, 11(1), 18; https://doi.org/10.3390/agronomy11010018
Received: 9 November 2020 / Revised: 9 December 2020 / Accepted: 21 December 2020 / Published: 24 December 2020
Synthetic hexaploid wheat (SHW) is a valuable resource for breeding because it possesses more desirable traits, such as better yield and abiotic and biotic stress tolerance than common wheat. In this study, our group developed a SHW line, named ‘SynDT’, which has markedly better characteristics than Korean bread wheat ‘Keumkang’. The SynDT line is thermotolerant as it rapidly expresses heat shock proteins under heat stress. In addition, this line exhibits resistance to leaf rust by inducing the expression of antifungal enzymes, mainly chitinase, along with the rapid and high expression of pathogen-related genes. Moreover, it possesses the favorable traits of its parent wheat lines Triticum durum #24 and Aegilops tauschii #52. Therefore, the SynDT wheat line can be used as a breeding material for improving local common wheat cultivars. View Full-Text
Keywords: synthetic wheat; heat stress; leaf rust synthetic wheat; heat stress; leaf rust
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MDPI and ACS Style

Truong, H.A.; Lee, H.; Kishii, M.; Hong, S.W.; Lee, H. Development and Characterization of Synthetic Hexaploid Wheat for Improving the Resistance of Common Wheat to Leaf Rust and Heat Stress. Agronomy 2021, 11, 18. https://doi.org/10.3390/agronomy11010018

AMA Style

Truong HA, Lee H, Kishii M, Hong SW, Lee H. Development and Characterization of Synthetic Hexaploid Wheat for Improving the Resistance of Common Wheat to Leaf Rust and Heat Stress. Agronomy. 2021; 11(1):18. https://doi.org/10.3390/agronomy11010018

Chicago/Turabian Style

Truong, Hai A., Hyeri Lee, Masahiro Kishii, Suk W. Hong, and Hojoung Lee. 2021. "Development and Characterization of Synthetic Hexaploid Wheat for Improving the Resistance of Common Wheat to Leaf Rust and Heat Stress" Agronomy 11, no. 1: 18. https://doi.org/10.3390/agronomy11010018

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