Zhao, M.;                     Jian, X.;                     Chen, S.;                     Chen, M.;                     Wang, G.;                     Gong, T.;                     Tian, Y.;                     Lu, X.;                     Zhao, Z.;                     Yang, X.    
        Research on the Mechanical Failure Risk Points of Ti/Cu/Ti/Au Metallization Layer. Crystals 2023, 13, 1625.
    https://doi.org/10.3390/cryst13121625
    AMA Style
    
                                Zhao M,                                 Jian X,                                 Chen S,                                 Chen M,                                 Wang G,                                 Gong T,                                 Tian Y,                                 Lu X,                                 Zhao Z,                                 Yang X.        
                Research on the Mechanical Failure Risk Points of Ti/Cu/Ti/Au Metallization Layer. Crystals. 2023; 13(12):1625.
        https://doi.org/10.3390/cryst13121625
    
    Chicago/Turabian Style
    
                                Zhao, Mingrui,                                 Xiaodong Jian,                                 Si Chen,                                 Minghui Chen,                                 Gang Wang,                                 Tao Gong,                                 Yangning Tian,                                 Xiangjun Lu,                                 Zhenbo Zhao,                                 and Xiaofeng Yang.        
                2023. "Research on the Mechanical Failure Risk Points of Ti/Cu/Ti/Au Metallization Layer" Crystals 13, no. 12: 1625.
        https://doi.org/10.3390/cryst13121625
    
    APA Style
    
                                Zhao, M.,                                 Jian, X.,                                 Chen, S.,                                 Chen, M.,                                 Wang, G.,                                 Gong, T.,                                 Tian, Y.,                                 Lu, X.,                                 Zhao, Z.,                                 & Yang, X.        
        
        (2023). Research on the Mechanical Failure Risk Points of Ti/Cu/Ti/Au Metallization Layer. Crystals, 13(12), 1625.
        https://doi.org/10.3390/cryst13121625