Bruneel, E.; Rijckaert, H.; Diez Sierra, J.; De Buysser, K.; Van Driessche, I.
An Evaluation of Nanoparticle Distribution in Solution-Derived YBa2Cu3O7−δ Nanocomposite Thin Films by XPS Depth Profiling in Combination with TEM Analysis. Crystals 2022, 12, 410.
https://doi.org/10.3390/cryst12030410
AMA Style
Bruneel E, Rijckaert H, Diez Sierra J, De Buysser K, Van Driessche I.
An Evaluation of Nanoparticle Distribution in Solution-Derived YBa2Cu3O7−δ Nanocomposite Thin Films by XPS Depth Profiling in Combination with TEM Analysis. Crystals. 2022; 12(3):410.
https://doi.org/10.3390/cryst12030410
Chicago/Turabian Style
Bruneel, Els, Hannes Rijckaert, Javier Diez Sierra, Klaartje De Buysser, and Isabel Van Driessche.
2022. "An Evaluation of Nanoparticle Distribution in Solution-Derived YBa2Cu3O7−δ Nanocomposite Thin Films by XPS Depth Profiling in Combination with TEM Analysis" Crystals 12, no. 3: 410.
https://doi.org/10.3390/cryst12030410
APA Style
Bruneel, E., Rijckaert, H., Diez Sierra, J., De Buysser, K., & Van Driessche, I.
(2022). An Evaluation of Nanoparticle Distribution in Solution-Derived YBa2Cu3O7−δ Nanocomposite Thin Films by XPS Depth Profiling in Combination with TEM Analysis. Crystals, 12(3), 410.
https://doi.org/10.3390/cryst12030410