Article Versions Notes

Zhu Y, Hu T, Wang M, Li Y, Ge M, Guo X, Deng H, Chen Z. Characterization of the Micro-Structural Properties of InAlN/GaN Epilayer Grown by MOCVD. Crystals. 2022; 12(2):203. https://doi.org/10.3390/cryst12020203

Zhu, Youhua, Tao Hu, Meiyu Wang, Yi Li, Mei Ge, Xinglong Guo, Honghai Deng, and Zhitao Chen. 2022. "Characterization of the Micro-Structural Properties of InAlN/GaN Epilayer Grown by MOCVD" Crystals 12, no. 2: 203. https://doi.org/10.3390/cryst12020203

Zhu, Y., Hu, T., Wang, M., Li, Y., Ge, M., Guo, X., Deng, H., & Chen, Z. (2022). Characterization of the Micro-Structural Properties of InAlN/GaN Epilayer Grown by MOCVD. Crystals, 12(2), 203. https://doi.org/10.3390/cryst12020203