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Journal: MicromachinesVolume: 16Number: 532
Article: Heavy Ions Induced Single-Event Transient in SiGe-on-SOI HBT by TCAD Simulation
  • Authors:
  • Yuedecai Long1,
  • Abuduwayiti Aierken1 and
  • Xuefei Liu1
  • et al.
Link: https://www.mdpi.com/2072-666X/16/5/532

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