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Journal: MicromachinesVolume: 12Number: 111
Article: Bias Stress Stability of Solution-Processed Nano Indium Oxide Thin Film Transistor
  • Authors:
  • Rihui Yao1,
  • Xiao Fu1 and
  • Wanwan Li1
  • et al.
Link: https://www.mdpi.com/2072-666X/12/2/111

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