Next Article in Journal
Enhancing Confidence and Interpretability of a CNN-Based Wafer Defect Classification Model Using Temperature Scaling and LIME
Previous Article in Journal
Power-Law Reliability Plotting for Microelectronics
 
 
Article

Article Versions Notes

Micromachines 2025, 16(9), 1056; https://doi.org/10.3390/mi16091056
Action Date Notes Link
article xml file uploaded 16 September 2025 14:51 CEST Original file -
article xml uploaded. 16 September 2025 14:51 CEST Update https://www.mdpi.com/2072-666X/16/9/1056/xml
article pdf uploaded. 16 September 2025 14:51 CEST Version of Record https://www.mdpi.com/2072-666X/16/9/1056/pdf
article html file updated 16 September 2025 14:52 CEST Original file https://www.mdpi.com/2072-666X/16/9/1056/html
Back to TopTop