Article Versions Notes

Liao X, Lei D, Fu Y, Liu Y, Huang K, Wei Y, Zuo Y, Ying Y, Liu Y, Xu C, et al. Total Ionizing Dose Effect Simulation Modeling and Analysis for a DCAP Power Chip. Micromachines. 2025; 16(8):917. https://doi.org/10.3390/mi16080917

Liao, Xinfang, Danyang Lei, Yanjun Fu, Yuchen Liu, Kangqi Huang, Yuan Wei, Yinghong Zuo, Yashi Ying, Yi Liu, Changqing Xu, and et al. 2025. "Total Ionizing Dose Effect Simulation Modeling and Analysis for a DCAP Power Chip" Micromachines 16, no. 8: 917. https://doi.org/10.3390/mi16080917

Liao, X., Lei, D., Fu, Y., Liu, Y., Huang, K., Wei, Y., Zuo, Y., Ying, Y., Liu, Y., Xu, C., & Yang, Y. (2025). Total Ionizing Dose Effect Simulation Modeling and Analysis for a DCAP Power Chip. Micromachines, 16(8), 917. https://doi.org/10.3390/mi16080917