Giorgino, G.; Miccoli, C.; Cioni, M.; Reina, S.; Wakrim, T.; Guillon, V.; Sama, N.Y.; Gaillard, P.; Zeghouane, M.; Chauveau, H.-J.;
et al. On-Wafer Gate Screening Test for Improved Pre-Reliability in p-GaN HEMTs. Micromachines 2025, 16, 873.
https://doi.org/10.3390/mi16080873
AMA Style
Giorgino G, Miccoli C, Cioni M, Reina S, Wakrim T, Guillon V, Sama NY, Gaillard P, Zeghouane M, Chauveau H-J,
et al. On-Wafer Gate Screening Test for Improved Pre-Reliability in p-GaN HEMTs. Micromachines. 2025; 16(8):873.
https://doi.org/10.3390/mi16080873
Chicago/Turabian Style
Giorgino, Giovanni, Cristina Miccoli, Marcello Cioni, Santo Reina, Tariq Wakrim, Virgil Guillon, Nossikpendou Yves Sama, Pauline Gaillard, Mohammed Zeghouane, Hyon-Ju Chauveau,
and et al. 2025. "On-Wafer Gate Screening Test for Improved Pre-Reliability in p-GaN HEMTs" Micromachines 16, no. 8: 873.
https://doi.org/10.3390/mi16080873
APA Style
Giorgino, G., Miccoli, C., Cioni, M., Reina, S., Wakrim, T., Guillon, V., Sama, N. Y., Gaillard, P., Zeghouane, M., Chauveau, H.-J., Castagna, M. E., Constant, A., Iucolano, F., & Chini, A.
(2025). On-Wafer Gate Screening Test for Improved Pre-Reliability in p-GaN HEMTs. Micromachines, 16(8), 873.
https://doi.org/10.3390/mi16080873
