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Journal: Micromachines, 2025
Volume: 16
Number: 242

Article: Electrothermal Failure Physics of GaN Schottky Diodes Under High-Temperature Forward Biasing
Authors: by Nahid Sultan Al-Mamun, Yuxin Du, Jianan Song, Rongming Chu and Aman Haque
Link: https://www.mdpi.com/2072-666X/16/3/242

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