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Journal: Micromachines, 2024
Volume: 15
Number: 769
Article:
An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage
Authors:
by
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Erik Bury, Robin Degraeve and Ben Kaczer
Link:
https://www.mdpi.com/2072-666X/15/6/769
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