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Journal: MicromachinesVolume: 15Number: 424
Article: Leakage and Thermal Reliability Optimization of Stacked Nanosheet Field-Effect Transistors with SiC Layers
  • Authors:
  • Cong Li1,*,
  • Yali Shao2 and
  • Fengyu Kuang1
  • et al.
Link: https://www.mdpi.com/2072-666X/15/4/424

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