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Journal: Micromachines, 2024
Volume: 15
Number: 80

Article: Review on Main Gate Characteristics of P-Type GaN Gate High-Electron-Mobility Transistors
Authors: by Zhongxu Wang, Jiao Nan, Zhiwen Tian, Pei Liu, Yinhe Wu and Jincheng Zhang
Link: https://www.mdpi.com/2072-666X/15/1/80

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