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Journal: MicromachinesVolume: 15Number: 101
Article: A Comparative Study on the Degradation Behaviors of Ferroelectric Gate GaN HEMT with PZT and PZT/Al2O3 Gate Stacks
  • Authors:
  • Lixiang Chen,
  • Zhiqi Lu and
  • Chaowei Fu
  • et al.
Link: https://www.mdpi.com/2072-666X/15/1/101

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