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Journal: Micromachines, 2023
Volume: 14
Number: 2073
Article:
Characteristics and Degradation Mechanisms under High Reverse Base–Collector Bias Stress in InGaAs/InP Double HBTs
Authors:
by
Silu Yan, Hongliang Lu, Lin Cheng, Jiantao Qiao, Wei Cheng and Yuming Zhang
Link:
https://www.mdpi.com/2072-666X/14/11/2073
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