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Journal: Micromachines, 2022
Volume: 13
Number: 1058

Article: An Efficient YOLO Algorithm with an Attention Mechanism for Vision-Based Defect Inspection Deployed on FPGA
Authors: by Longzhen Yu, Jianhua Zhu, Qian Zhao and Zhixian Wang
Link: https://www.mdpi.com/2072-666X/13/7/1058

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