Article Versions Notes

Meli A, Muoio A, Reitano R, Sangregorio E, Calcagno L, Trotta A, Parisi M, Meda L, La Via F. Effect of the Oxidation Process on Carrier Lifetime and on SF Defects of 4H SiC Thick Epilayer for Detection Applications. Micromachines. 2022; 13(7):1042. https://doi.org/10.3390/mi13071042

Meli, Alessandro, Annamaria Muoio, Riccardo Reitano, Enrico Sangregorio, Lucia Calcagno, Antonio Trotta, Miriam Parisi, Laura Meda, and Francesco La Via. 2022. "Effect of the Oxidation Process on Carrier Lifetime and on SF Defects of 4H SiC Thick Epilayer for Detection Applications" Micromachines 13, no. 7: 1042. https://doi.org/10.3390/mi13071042

Meli, A., Muoio, A., Reitano, R., Sangregorio, E., Calcagno, L., Trotta, A., Parisi, M., Meda, L., & La Via, F. (2022). Effect of the Oxidation Process on Carrier Lifetime and on SF Defects of 4H SiC Thick Epilayer for Detection Applications. Micromachines, 13(7), 1042. https://doi.org/10.3390/mi13071042