Meng, Q.; Lin, Q.; Jing, W.; Zhao, N.; Yang, P.; Lu, D.
Investigation on the Effect of Annealing Temperature on the Side Ohmic Contact Characteristics for Double Channel GaN/AlGaN Epitaxial Layer. Micromachines 2022, 13, 791.
https://doi.org/10.3390/mi13050791
AMA Style
Meng Q, Lin Q, Jing W, Zhao N, Yang P, Lu D.
Investigation on the Effect of Annealing Temperature on the Side Ohmic Contact Characteristics for Double Channel GaN/AlGaN Epitaxial Layer. Micromachines. 2022; 13(5):791.
https://doi.org/10.3390/mi13050791
Chicago/Turabian Style
Meng, Qingzhi, Qijing Lin, Weixuan Jing, Na Zhao, Ping Yang, and Dejiang Lu.
2022. "Investigation on the Effect of Annealing Temperature on the Side Ohmic Contact Characteristics for Double Channel GaN/AlGaN Epitaxial Layer" Micromachines 13, no. 5: 791.
https://doi.org/10.3390/mi13050791
APA Style
Meng, Q., Lin, Q., Jing, W., Zhao, N., Yang, P., & Lu, D.
(2022). Investigation on the Effect of Annealing Temperature on the Side Ohmic Contact Characteristics for Double Channel GaN/AlGaN Epitaxial Layer. Micromachines, 13(5), 791.
https://doi.org/10.3390/mi13050791