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Journal: Micromachines, 2022
Volume: 13
Number: 1860

Article: Combined Effect of TID Radiation and Electrical Stress on NMOSFETs
Authors: by Yanrong Cao, Min Wang, Xuefeng Zheng, Enxia Zhang, Ling Lv, Liang Wang, Maodan Ma, Hanghang Lv, Zhiheng Wang, Yongkun Wang, Wenchao Tian, Xiaohua Ma and Yue Hao
Link: https://www.mdpi.com/2072-666X/13/11/1860

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