Bian, Z.; Hong, X.; Guo, Y.; Naviner, L.; Ge, W.; Cai, H.
Investigation of PVT-Aware STT-MRAM Sensing Circuits for Low-VDD Scenario. Micromachines 2021, 12, 551.
https://doi.org/10.3390/mi12050551
AMA Style
Bian Z, Hong X, Guo Y, Naviner L, Ge W, Cai H.
Investigation of PVT-Aware STT-MRAM Sensing Circuits for Low-VDD Scenario. Micromachines. 2021; 12(5):551.
https://doi.org/10.3390/mi12050551
Chicago/Turabian Style
Bian, Zhongjian, Xiaofeng Hong, Yanan Guo, Lirida Naviner, Wei Ge, and Hao Cai.
2021. "Investigation of PVT-Aware STT-MRAM Sensing Circuits for Low-VDD Scenario" Micromachines 12, no. 5: 551.
https://doi.org/10.3390/mi12050551
APA Style
Bian, Z., Hong, X., Guo, Y., Naviner, L., Ge, W., & Cai, H.
(2021). Investigation of PVT-Aware STT-MRAM Sensing Circuits for Low-VDD Scenario. Micromachines, 12(5), 551.
https://doi.org/10.3390/mi12050551