Tajalli, A.; Borga, M.; Meneghini, M.; De Santi, C.; Benazzi, D.; Besendörfer, S.; Püsche, R.; Derluyn, J.; Degroote, S.; Germain, M.;
et al. Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment. Micromachines 2020, 11, 101.
https://doi.org/10.3390/mi11010101
AMA Style
Tajalli A, Borga M, Meneghini M, De Santi C, Benazzi D, Besendörfer S, Püsche R, Derluyn J, Degroote S, Germain M,
et al. Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment. Micromachines. 2020; 11(1):101.
https://doi.org/10.3390/mi11010101
Chicago/Turabian Style
Tajalli, Alaleh, Matteo Borga, Matteo Meneghini, Carlo De Santi, Davide Benazzi, Sven Besendörfer, Roland Püsche, Joff Derluyn, Stefan Degroote, Marianne Germain,
and et al. 2020. "Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment" Micromachines 11, no. 1: 101.
https://doi.org/10.3390/mi11010101
APA Style
Tajalli, A., Borga, M., Meneghini, M., De Santi, C., Benazzi, D., Besendörfer, S., Püsche, R., Derluyn, J., Degroote, S., Germain, M., Kabouche, R., Abid, I., Meissner, E., Zanoni, E., Medjdoub, F., & Meneghesso, G.
(2020). Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment. Micromachines, 11(1), 101.
https://doi.org/10.3390/mi11010101