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Journal: Micromachines, 2019
Volume: 10
Number: 256
Article:
A Technology-Computer-Aided-Design-Based Reliability Prediction Model for DRAM Storage Capacitors
Authors:
by
Woo Young Choi, Gyuhan Yoon, Woo Young Chung, Younghoon Cho, Seongun Shin and Kwang Ho Ahn
Link:
https://www.mdpi.com/2072-666X/10/4/256
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