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Journal: Micromachines, 2019
Volume: 10
Number: 256

Article: A Technology-Computer-Aided-Design-Based Reliability Prediction Model for DRAM Storage Capacitors
Authors: by Woo Young Choi, Gyuhan Yoon, Woo Young Chung, Younghoon Cho, Seongun Shin and Kwang Ho Ahn
Link: https://www.mdpi.com/2072-666X/10/4/256

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