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Journal: Micromachines, 2019
Volume: 10
Number: 5
Article:
Empirical and Theoretical Modeling of Low-Frequency Noise Behavior of Ultrathin Silicon-on-Insulator MOSFETs Aiming at Low-Voltage and Low-Energy Regime
Authors:
by
Yasuhisa Omura
Link:
https://www.mdpi.com/2072-666X/10/1/5
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