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Journal: Micromachines, 2019
Volume: 10
Number: 5

Article: Empirical and Theoretical Modeling of Low-Frequency Noise Behavior of Ultrathin Silicon-on-Insulator MOSFETs Aiming at Low-Voltage and Low-Energy Regime
Authors: by Yasuhisa Omura
Link: https://www.mdpi.com/2072-666X/10/1/5

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