Article Versions Notes

Hernandez J, Lobos GA, Matus I, Del Pozo A, Silva P, Galleguillos M. Using Ridge Regression Models to Estimate Grain Yield from Field Spectral Data in Bread Wheat (Triticum Aestivum L.) Grown under Three Water Regimes. Remote Sensing. 2015; 7(2):2109-2126. https://doi.org/10.3390/rs70202109

Hernandez, Javier, Gustavo A. Lobos, Iván Matus, Alejandro Del Pozo, Paola Silva, and Mauricio Galleguillos. 2015. "Using Ridge Regression Models to Estimate Grain Yield from Field Spectral Data in Bread Wheat (Triticum Aestivum L.) Grown under Three Water Regimes" Remote Sensing 7, no. 2: 2109-2126. https://doi.org/10.3390/rs70202109

Hernandez, J., Lobos, G. A., Matus, I., Del Pozo, A., Silva, P., & Galleguillos, M. (2015). Using Ridge Regression Models to Estimate Grain Yield from Field Spectral Data in Bread Wheat (Triticum Aestivum L.) Grown under Three Water Regimes. Remote Sensing, 7(2), 2109-2126. https://doi.org/10.3390/rs70202109