Chen, T.; Pan, J.; Chang, S.; Xiong, C.; Shi, J.; Liu, M.; Che, T.; Wang, L.; Liu, H.
Validation of the SNTHERM Model Applied for Snow Depth, Grain Size, and Brightness Temperature Simulation at Meteorological Stations in China. Remote Sens. 2020, 12, 507.
https://doi.org/10.3390/rs12030507
AMA Style
Chen T, Pan J, Chang S, Xiong C, Shi J, Liu M, Che T, Wang L, Liu H.
Validation of the SNTHERM Model Applied for Snow Depth, Grain Size, and Brightness Temperature Simulation at Meteorological Stations in China. Remote Sensing. 2020; 12(3):507.
https://doi.org/10.3390/rs12030507
Chicago/Turabian Style
Chen, Tao, Jinmei Pan, Shunli Chang, Chuan Xiong, Jiancheng Shi, Mingyu Liu, Tao Che, Lifu Wang, and Hongrui Liu.
2020. "Validation of the SNTHERM Model Applied for Snow Depth, Grain Size, and Brightness Temperature Simulation at Meteorological Stations in China" Remote Sensing 12, no. 3: 507.
https://doi.org/10.3390/rs12030507
APA Style
Chen, T., Pan, J., Chang, S., Xiong, C., Shi, J., Liu, M., Che, T., Wang, L., & Liu, H.
(2020). Validation of the SNTHERM Model Applied for Snow Depth, Grain Size, and Brightness Temperature Simulation at Meteorological Stations in China. Remote Sensing, 12(3), 507.
https://doi.org/10.3390/rs12030507