We have studied three-dimensional (3D) configurations of dislocations in the β phase of a Ti–35mass%Nb alloy by means of single-axis tilt tomography using bright-field scanning transmission electron microscopy (BF-STEM). To visualize dislocations, the hh
0 systematic reflections were excited throughout tilt-series acquisition with the maximum tilt angle of 70°. Dislocations in the β grains were clearly reconstructed by the weighted back-projection algorithm. The slip planes of the dislocations were deduced by rotating the reconstructed volumes with the aid of selected area electron diffraction patterns. It was found that BF-STEM images with relatively low contrasts, taken along low-order zone axes, are capable to reproduce and preserve the quality of reconstructed image of dislocations. We also found that tilt angles as low as 40° are practically acceptable to visualize 3D configurations of dislocations, while there exists limitation in resolution due to the existence of a large missing wedge.
This is an open access article distributed under the Creative Commons Attribution License
which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited