Dai, H.; Hou, Z.; Han, X.; Liang, J.; Jiao, A.; Wei, Z.; Wu, C.; Sun, K.; Liu, Y.; Wang, X.
Non-Destructive Evaluation of Damage and Electricity Characteristics in 4H-SiC Induced by Ion Irradiation via Raman Spectroscopy. Materials 2025, 18, 5057.
https://doi.org/10.3390/ma18215057
AMA Style
Dai H, Hou Z, Han X, Liang J, Jiao A, Wei Z, Wu C, Sun K, Liu Y, Wang X.
Non-Destructive Evaluation of Damage and Electricity Characteristics in 4H-SiC Induced by Ion Irradiation via Raman Spectroscopy. Materials. 2025; 18(21):5057.
https://doi.org/10.3390/ma18215057
Chicago/Turabian Style
Dai, Hui, Zhiyan Hou, Xinqing Han, Jiacheng Liang, Anxin Jiao, Zhixian Wei, Chen Wu, Ke Sun, Yong Liu, and Xuelin Wang.
2025. "Non-Destructive Evaluation of Damage and Electricity Characteristics in 4H-SiC Induced by Ion Irradiation via Raman Spectroscopy" Materials 18, no. 21: 5057.
https://doi.org/10.3390/ma18215057
APA Style
Dai, H., Hou, Z., Han, X., Liang, J., Jiao, A., Wei, Z., Wu, C., Sun, K., Liu, Y., & Wang, X.
(2025). Non-Destructive Evaluation of Damage and Electricity Characteristics in 4H-SiC Induced by Ion Irradiation via Raman Spectroscopy. Materials, 18(21), 5057.
https://doi.org/10.3390/ma18215057
