Article Versions Notes

Ostrowska K, Sładek J, Wołkanowski P, Dominik I, Owczarek D, Nykiel M, Tomczyk K, Stoliński M. A New Methodology for Selecting CT Scanning Parameters Depending on the Density of Materials. Materials. 2024; 17(24):6172. https://doi.org/10.3390/ma17246172

Ostrowska, Ksenia, Jerzy Sładek, Paweł Wołkanowski, Ireneusz Dominik, Danuta Owczarek, Marek Nykiel, Krzysztof Tomczyk, and Michał Stoliński. 2024. "A New Methodology for Selecting CT Scanning Parameters Depending on the Density of Materials" Materials 17, no. 24: 6172. https://doi.org/10.3390/ma17246172

Ostrowska, K., Sładek, J., Wołkanowski, P., Dominik, I., Owczarek, D., Nykiel, M., Tomczyk, K., & Stoliński, M. (2024). A New Methodology for Selecting CT Scanning Parameters Depending on the Density of Materials. Materials, 17(24), 6172. https://doi.org/10.3390/ma17246172