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Journal: Materials, 2023
Volume: 16
Number: 2317
Article:
Low-Frequency Noise-Based Mechanism Analysis of Endurance Degradation in Al/αTiOx/Al Resistive Random Access Memory Devices
Authors:
by
Jung-Kyu Lee, Juyeong Pyo and Sungjun Kim
Link:
https://www.mdpi.com/1996-1944/16/6/2317
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