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Journal: Materials, 2023
Volume: 16
Number: 2244
Article:
Ion-Induced Lateral Damage in the Focused Ion Beam Patterning of Topological Insulator Bi2Se3 Thin Films
Authors:
by
Rubén Gracia-Abad, Soraya Sangiao, Sandeep Kumar Chaluvadi, Pasquale Orgiani and José MarÃa De Teresa
Link:
https://www.mdpi.com/1996-1944/16/6/2244
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