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Journal: Materials, 2023
Volume: 16
Number: 2244

Article: Ion-Induced Lateral Damage in the Focused Ion Beam Patterning of Topological Insulator Bi2Se3 Thin Films
Authors: by Rubén Gracia-Abad, Soraya Sangiao, Sandeep Kumar Chaluvadi, Pasquale Orgiani and José María De Teresa
Link: https://www.mdpi.com/1996-1944/16/6/2244

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