Wu, Z.; Liu, Y.; Zhou, J.; Zhao, H.; Qin, Z.
Interface Structure, Dielectric Behavior and Temperature Stability of Ba(Mg1/3Ta2/3)O3/PbZr0.52Ti0.48O3 Thin Films. Materials 2023, 16, 6358.
https://doi.org/10.3390/ma16196358
AMA Style
Wu Z, Liu Y, Zhou J, Zhao H, Qin Z.
Interface Structure, Dielectric Behavior and Temperature Stability of Ba(Mg1/3Ta2/3)O3/PbZr0.52Ti0.48O3 Thin Films. Materials. 2023; 16(19):6358.
https://doi.org/10.3390/ma16196358
Chicago/Turabian Style
Wu, Zhi, Yifei Liu, Jing Zhou, Hong Zhao, and Zhihui Qin.
2023. "Interface Structure, Dielectric Behavior and Temperature Stability of Ba(Mg1/3Ta2/3)O3/PbZr0.52Ti0.48O3 Thin Films" Materials 16, no. 19: 6358.
https://doi.org/10.3390/ma16196358
APA Style
Wu, Z., Liu, Y., Zhou, J., Zhao, H., & Qin, Z.
(2023). Interface Structure, Dielectric Behavior and Temperature Stability of Ba(Mg1/3Ta2/3)O3/PbZr0.52Ti0.48O3 Thin Films. Materials, 16(19), 6358.
https://doi.org/10.3390/ma16196358