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Article

Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction

1
Aix Marseille Univ, Univ Toulon, CNRS, IM2NP, CEDEX 20, 13397 Marseille, France
2
Synchrotron SOLEIL, L’Orme des Merisiers, Saint-Aubin-BP 48, 91192 Gif-sur-Yvette, France
3
Faculty of Mechanical Engineering, University of Rio Verde (UniRV), Rio Verde 75901-970, Brazil
4
School of Natural Sciences and Engineering, Department of Physics and Chemistry, São Paulo State University (UNESP), Ilha Solteira 15385-000, Brazil
5
Department of Physics & CICECO—Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal
6
Laboratory of Functional Low-Dimensional Structures, National University of Science and Technology MISiS, 119049 Moscow, Russia
*
Author to whom correspondence should be addressed.
Materials 2020, 13(15), 3338; https://doi.org/10.3390/ma13153338
Received: 1 July 2020 / Revised: 20 July 2020 / Accepted: 24 July 2020 / Published: 27 July 2020
(This article belongs to the Special Issue X-ray Diffraction of Functional Materials)
The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering more than four orders of magnitude. The Bragg reflections for thin films with low lanthanum concentration exhibit a double-peak structure, indicating two contributions, whereas thin films with 12% La possess a well-defined Bragg peak with a single component. In addition, built-in electric fields are revealed for low La concentrations, while they are absent for thin films with 12% of La. For static and low frequency AC electric fields, all lanthanum-modified lead zirconate titanate thin films exhibit butterfly loops, whereas linear piezoelectric behavior is found for AC frequencies larger than 1 Hz. View Full-Text
Keywords: X-ray diffraction; piezoelectric properties; lanthanum-modified lead zirconate titanate (PLZT) X-ray diffraction; piezoelectric properties; lanthanum-modified lead zirconate titanate (PLZT)
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MDPI and ACS Style

Cornelius, T.W.; Mocuta, C.; Escoubas, S.; Lima, L.R.M.; Araújo, E.B.; Kholkin, A.L.; Thomas, O. Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction. Materials 2020, 13, 3338. https://doi.org/10.3390/ma13153338

AMA Style

Cornelius TW, Mocuta C, Escoubas S, Lima LRM, Araújo EB, Kholkin AL, Thomas O. Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction. Materials. 2020; 13(15):3338. https://doi.org/10.3390/ma13153338

Chicago/Turabian Style

Cornelius, Thomas W.; Mocuta, Cristian; Escoubas, Stéphanie; Lima, Luiz R.M.; Araújo, Eudes B.; Kholkin, Andrei L.; Thomas, Olivier. 2020. "Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction" Materials 13, no. 15: 3338. https://doi.org/10.3390/ma13153338

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