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Journal: Materials, 2019
Volume: 12
Number: 1492

Article: Characteristic Fluctuations of Dynamic Power Delay Induced by Random Nanosized Titanium Nitride Grains and the Aspect Ratio Effect of Gate-All-Around Nanowire CMOS Devices and Circuits
Authors: by Yiming Li, Chieh-Yang Chen, Min-Hui Chuang and Pei-Jung Chao
Link: https://www.mdpi.com/1996-1944/12/9/1492

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