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Journal: MaterialsVolume: 12Number: 1492
Article: Characteristic Fluctuations of Dynamic Power Delay Induced by Random Nanosized Titanium Nitride Grains and the Aspect Ratio Effect of Gate-All-Around Nanowire CMOS Devices and Circuits
- Authors:
- Yiming Li*,
- Chieh-Yang Chen and
- Min-Hui Chuang
- et al.
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