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Journal: MaterialsVolume: 11Number: 1440
Article: Enhancement of Electrical Characteristics and Stability of Amorphous Si-Sn-O Thin Film Transistors with SiOx Passivation Layer
  • Authors:
  • Xianzhe Liu1,
  • Weijing Wu1 and
  • Weifeng Chen1
  • et al.
Link: https://www.mdpi.com/1996-1944/11/8/1440

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