Order Article Reprints

Liu X, Wu W, Chen W, Ning H, Zhang X, Yuan W, Xiong M, Wang X, Yao R, Peng J. Enhancement of Electrical Characteristics and Stability of Amorphous Si-Sn-O Thin Film Transistors with SiO_x Passivation Layer. Materials. 2018; 11(8):1440. https://doi.org/10.3390/ma11081440

Liu, Xianzhe, Weijing Wu, Weifeng Chen, Honglong Ning, Xiaochen Zhang, Weijian Yuan, Mei Xiong, Xiaofeng Wang, Rihui Yao, and Junbiao Peng. 2018. "Enhancement of Electrical Characteristics and Stability of Amorphous Si-Sn-O Thin Film Transistors with SiO_x Passivation Layer" Materials 11, no. 8: 1440. https://doi.org/10.3390/ma11081440

Liu, X., Wu, W., Chen, W., Ning, H., Zhang, X., Yuan, W., Xiong, M., Wang, X., Yao, R., & Peng, J. (2018). Enhancement of Electrical Characteristics and Stability of Amorphous Si-Sn-O Thin Film Transistors with SiO_x Passivation Layer. Materials, 11(8), 1440. https://doi.org/10.3390/ma11081440