Comelli, D.; Artesani, A.; Nevin, A.; Mosca, S.; Gonzalez, V.; Eveno, M.; Valentini, G.
Time-Resolved Photoluminescence Microscopy for the Analysis of Semiconductor-Based Paint Layers. Materials 2017, 10, 1335.
https://doi.org/10.3390/ma10111335
AMA Style
Comelli D, Artesani A, Nevin A, Mosca S, Gonzalez V, Eveno M, Valentini G.
Time-Resolved Photoluminescence Microscopy for the Analysis of Semiconductor-Based Paint Layers. Materials. 2017; 10(11):1335.
https://doi.org/10.3390/ma10111335
Chicago/Turabian Style
Comelli, Daniela, Alessia Artesani, Austin Nevin, Sara Mosca, Victor Gonzalez, Myriam Eveno, and Gianluca Valentini.
2017. "Time-Resolved Photoluminescence Microscopy for the Analysis of Semiconductor-Based Paint Layers" Materials 10, no. 11: 1335.
https://doi.org/10.3390/ma10111335
APA Style
Comelli, D., Artesani, A., Nevin, A., Mosca, S., Gonzalez, V., Eveno, M., & Valentini, G.
(2017). Time-Resolved Photoluminescence Microscopy for the Analysis of Semiconductor-Based Paint Layers. Materials, 10(11), 1335.
https://doi.org/10.3390/ma10111335