Next Article in Journal
Auxeticity of Yukawa Systems with Nanolayers in the (111) Crystallographic Plane
Next Article in Special Issue
Thermoluminescence as a Research Tool to Investigate Luminescence Mechanisms
Previous Article in Journal
Multifunctional Carbon Aerogels Derived by Sol–Gel Process of Natural Polysaccharides of Different Botanical Origin
Previous Article in Special Issue
Study on Scattering and Absorption Properties of Quantum-Dot-Converted Elements for Light-Emitting Diodes Using Finite-Difference Time-Domain Method
Open AccessFeature PaperArticle

Time-Resolved Photoluminescence Microscopy for the Analysis of Semiconductor-Based Paint Layers

1
Physics Department, Politecnico di Milano, Piazza Leonardo da Vinci, 20133 Milano, Italy
2
Istituto di Fotonica e Nanotecnologie-Consiglio Nazionale delle Ricerche (IFN-CNR), Piazza Leonardo da Vinci, 20133 Milano, Italy
3
Centre de Recherche et de Restauration des Musées de France (C2RMF), Palais du Louvre, F-75001 Paris, France
4
Chimie Paris-Tech, PSL Research University, CNRS, Institut de Recherche de Chimie Paris (IRCP), F-75005 Paris, France
*
Author to whom correspondence should be addressed.
Materials 2017, 10(11), 1335; https://doi.org/10.3390/ma10111335
Received: 29 September 2017 / Revised: 9 November 2017 / Accepted: 18 November 2017 / Published: 21 November 2017
In conservation, science semiconductors occur as the constituent matter of the so-called semiconductor pigments, produced following the Industrial Revolution and extensively used by modern painters. With recent research highlighting the occurrence of various degradation phenomena in semiconductor paints, it is clear that their detection by conventional optical fluorescence imaging and microscopy is limited by the complexity of historical painting materials. Here, we illustrate and prove the capabilities of time-resolved photoluminescence (TRPL) microscopy, equipped with both spectral and lifetime sensitivity at timescales ranging from nanoseconds to hundreds of microseconds, for the analysis of cross-sections of paint layers made of luminescent semiconductor pigments. The method is sensitive to heterogeneities within micro-samples and provides valuable information for the interpretation of the nature of the emissions in samples. A case study is presented on micro samples from a painting by Henri Matisse and serves to demonstrate how TRPL can be used to identify the semiconductor pigments zinc white and cadmium yellow, and to inform future investigations of the degradation of a cadmium yellow paint. View Full-Text
Keywords: time-resolved photoluminescence; photoluminescence microscopy; semiconductor pigments; trap state levels; zinc white; cadmium yellow time-resolved photoluminescence; photoluminescence microscopy; semiconductor pigments; trap state levels; zinc white; cadmium yellow
Show Figures

Graphical abstract

MDPI and ACS Style

Comelli, D.; Artesani, A.; Nevin, A.; Mosca, S.; Gonzalez, V.; Eveno, M.; Valentini, G. Time-Resolved Photoluminescence Microscopy for the Analysis of Semiconductor-Based Paint Layers. Materials 2017, 10, 1335.

Show more citation formats Show less citations formats
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

1
Back to TopTop