Jung, Y.; Min, K.H.; Bae, S.; Kang, Y.; Kim, D.; Lee, H.-S.
Variations in Minority Carrier-Trapping Effects Caused by Hydrogen Passivation in Multicrystalline Silicon Wafer. Energies 2020, 13, 5783.
https://doi.org/10.3390/en13215783
AMA Style
Jung Y, Min KH, Bae S, Kang Y, Kim D, Lee H-S.
Variations in Minority Carrier-Trapping Effects Caused by Hydrogen Passivation in Multicrystalline Silicon Wafer. Energies. 2020; 13(21):5783.
https://doi.org/10.3390/en13215783
Chicago/Turabian Style
Jung, Yujin, Kwan Hong Min, Soohyun Bae, Yoonmook Kang, Donghwan Kim, and Hae-Seok Lee.
2020. "Variations in Minority Carrier-Trapping Effects Caused by Hydrogen Passivation in Multicrystalline Silicon Wafer" Energies 13, no. 21: 5783.
https://doi.org/10.3390/en13215783
APA Style
Jung, Y., Min, K. H., Bae, S., Kang, Y., Kim, D., & Lee, H.-S.
(2020). Variations in Minority Carrier-Trapping Effects Caused by Hydrogen Passivation in Multicrystalline Silicon Wafer. Energies, 13(21), 5783.
https://doi.org/10.3390/en13215783