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Journal: Energies, 2017
Volume: 10
Number: 233

Article: Evaluation and Reliability Assessment of GaN-on-Si MIS-HEMT for Power Switching Applications
Authors: by Po-Chien Chou, Szu-Hao Chen, Ting-En Hsieh, Stone Cheng, Jesús A. Del Alamo and Edward Yi Chang
Link: https://www.mdpi.com/1996-1073/10/2/233

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