Chou, P.-C.; Chen, S.-H.; Hsieh, T.-E.; Cheng, S.; Del Alamo, J.A.; Chang, E.Y.
Evaluation and Reliability Assessment of GaN-on-Si MIS-HEMT for Power Switching Applications. Energies 2017, 10, 233.
https://doi.org/10.3390/en10020233
AMA Style
Chou P-C, Chen S-H, Hsieh T-E, Cheng S, Del Alamo JA, Chang EY.
Evaluation and Reliability Assessment of GaN-on-Si MIS-HEMT for Power Switching Applications. Energies. 2017; 10(2):233.
https://doi.org/10.3390/en10020233
Chicago/Turabian Style
Chou, Po-Chien, Szu-Hao Chen, Ting-En Hsieh, Stone Cheng, Jesús A. Del Alamo, and Edward Yi Chang.
2017. "Evaluation and Reliability Assessment of GaN-on-Si MIS-HEMT for Power Switching Applications" Energies 10, no. 2: 233.
https://doi.org/10.3390/en10020233
APA Style
Chou, P.-C., Chen, S.-H., Hsieh, T.-E., Cheng, S., Del Alamo, J. A., & Chang, E. Y.
(2017). Evaluation and Reliability Assessment of GaN-on-Si MIS-HEMT for Power Switching Applications. Energies, 10(2), 233.
https://doi.org/10.3390/en10020233