Jeon, C.; Kim, M.; Kim, J.; Yang, S.; Choi, E.; Lim, B.
Systematic Analysis of Driving Modes and NiFe Layer Thickness in Planar Hall Magnetoresistance Sensors. Sensors 2025, 25, 1235.
https://doi.org/10.3390/s25041235
AMA Style
Jeon C, Kim M, Kim J, Yang S, Choi E, Lim B.
Systematic Analysis of Driving Modes and NiFe Layer Thickness in Planar Hall Magnetoresistance Sensors. Sensors. 2025; 25(4):1235.
https://doi.org/10.3390/s25041235
Chicago/Turabian Style
Jeon, Changyeop, Mijin Kim, Jinwoo Kim, Sunghee Yang, Eunseo Choi, and Byeonghwa Lim.
2025. "Systematic Analysis of Driving Modes and NiFe Layer Thickness in Planar Hall Magnetoresistance Sensors" Sensors 25, no. 4: 1235.
https://doi.org/10.3390/s25041235
APA Style
Jeon, C., Kim, M., Kim, J., Yang, S., Choi, E., & Lim, B.
(2025). Systematic Analysis of Driving Modes and NiFe Layer Thickness in Planar Hall Magnetoresistance Sensors. Sensors, 25(4), 1235.
https://doi.org/10.3390/s25041235