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Journal: Sensors, 2025
Volume: 25
Number: 3396

Article: Multi-Dimensional Anomaly Detection and Fault Localization in Microservice Architectures: A Dual-Channel Deep Learning Approach with Causal Inference for Intelligent Sensing
Authors: by Suchuan Xing, Yihan Wang and Wenhe Liu
Link: https://www.mdpi.com/1424-8220/25/11/3396

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