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        Journal: Sensors, 2025
        Volume: 25 
                	Number: 3396 
                
        
        Article:
        Multi-Dimensional Anomaly Detection and Fault Localization in Microservice Architectures: A Dual-Channel Deep Learning Approach with Causal Inference for Intelligent Sensing 
        Authors: 
       	by
                    Suchuan Xing, Yihan Wang and Wenhe Liu        
        Link:
        https://www.mdpi.com/1424-8220/25/11/3396
        
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