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Journal: Sensors, 2024
Volume: 24
Number: 429
Article:
From Anomaly Detection to Defect Classification
Authors:
by
Jaromír Klarák, Robert Andok, Peter Malík, Ivan Kuric, Mário Ritomský, Ivana Klačková and Hung-Yin Tsai
Link:
https://www.mdpi.com/1424-8220/24/2/429
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