Jeong, H.; Ntolkeras, G.; Warbrick, T.; Jaschke, M.; Gupta, R.; Lev, M.H.; Peters, J.M.; Grant, P.E.; Bonmassar, G.
Aluminum Thin Film Nanostructure Traces in Pediatric EEG Net for MRI and CT Artifact Reduction. Sensors 2023, 23, 3633.
https://doi.org/10.3390/s23073633
AMA Style
Jeong H, Ntolkeras G, Warbrick T, Jaschke M, Gupta R, Lev MH, Peters JM, Grant PE, Bonmassar G.
Aluminum Thin Film Nanostructure Traces in Pediatric EEG Net for MRI and CT Artifact Reduction. Sensors. 2023; 23(7):3633.
https://doi.org/10.3390/s23073633
Chicago/Turabian Style
Jeong, Hongbae, Georgios Ntolkeras, Tracy Warbrick, Manfred Jaschke, Rajiv Gupta, Michael H. Lev, Jurriaan M. Peters, Patricia Ellen Grant, and Giorgio Bonmassar.
2023. "Aluminum Thin Film Nanostructure Traces in Pediatric EEG Net for MRI and CT Artifact Reduction" Sensors 23, no. 7: 3633.
https://doi.org/10.3390/s23073633
APA Style
Jeong, H., Ntolkeras, G., Warbrick, T., Jaschke, M., Gupta, R., Lev, M. H., Peters, J. M., Grant, P. E., & Bonmassar, G.
(2023). Aluminum Thin Film Nanostructure Traces in Pediatric EEG Net for MRI and CT Artifact Reduction. Sensors, 23(7), 3633.
https://doi.org/10.3390/s23073633