Article Versions Notes

Sen D, Fernández A, Crozier D, Henrich B, Sokolov AV, Scully MO, Rooney WL, Verhoef AJ. Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy. Sensors. 2023; 23(2):707. https://doi.org/10.3390/s23020707

Sen, Dipankar, Alma Fernández, Daniel Crozier, Brian Henrich, Alexei V. Sokolov, Marlan O. Scully, William L. Rooney, and Aart J. Verhoef. 2023. "Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy" Sensors 23, no. 2: 707. https://doi.org/10.3390/s23020707

Sen, D., Fernández, A., Crozier, D., Henrich, B., Sokolov, A. V., Scully, M. O., Rooney, W. L., & Verhoef, A. J. (2023). Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy. Sensors, 23(2), 707. https://doi.org/10.3390/s23020707