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Journal: Sensors, 2023
Volume: 23
Number: 5922

Article: DG-GAN: A High Quality Defect Image Generation Method for Defect Detection
Authors: by Xiangjie He, Zhongqiang Luo, Quanyang Li, Hongbo Chen and Feng Li
Link: https://www.mdpi.com/1424-8220/23/13/5922

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