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Journal: SensorsVolume: 22Number: 33
Article: Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell
  • Authors:
  • Bharathi Raj Muthu1,*,
  • Ewins Pon Pushpa1 and
  • Vaithiyanathan Dhandapani2
  • et al.
Link: https://www.mdpi.com/1424-8220/22/1/33

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