Abelé, R.; Damoiseaux, J.-L.; Moubtahij, R.E.; Boi, J.-M.; Fronte, D.; Liardet, P.-Y.; Merad, D.
Spatial Location in Integrated Circuits through Infrared Microscopy. Sensors 2021, 21, 2175.
https://doi.org/10.3390/s21062175
AMA Style
Abelé R, Damoiseaux J-L, Moubtahij RE, Boi J-M, Fronte D, Liardet P-Y, Merad D.
Spatial Location in Integrated Circuits through Infrared Microscopy. Sensors. 2021; 21(6):2175.
https://doi.org/10.3390/s21062175
Chicago/Turabian Style
Abelé, Raphaël, Jean-Luc Damoiseaux, Redouane El Moubtahij, Jean-Marc Boi, Daniele Fronte, Pierre-Yvan Liardet, and Djamal Merad.
2021. "Spatial Location in Integrated Circuits through Infrared Microscopy" Sensors 21, no. 6: 2175.
https://doi.org/10.3390/s21062175
APA Style
Abelé, R., Damoiseaux, J.-L., Moubtahij, R. E., Boi, J.-M., Fronte, D., Liardet, P.-Y., & Merad, D.
(2021). Spatial Location in Integrated Circuits through Infrared Microscopy. Sensors, 21(6), 2175.
https://doi.org/10.3390/s21062175