Article Versions Notes

Shi L, Wang H, Ma X, Wang Y, Wang F, Zhao D, Shen D. The Deformation Behavior and Bending Emissions of ZnO Microwire Affected by Deformation-Induced Defects and Thermal Tunneling Effect. Sensors. 2021; 21(17):5887. https://doi.org/10.3390/s21175887

Shi, Linlin, Hong Wang, Xiaohui Ma, Yunpeng Wang, Fei Wang, Dongxu Zhao, and Dezhen Shen. 2021. "The Deformation Behavior and Bending Emissions of ZnO Microwire Affected by Deformation-Induced Defects and Thermal Tunneling Effect" Sensors 21, no. 17: 5887. https://doi.org/10.3390/s21175887

Shi, L., Wang, H., Ma, X., Wang, Y., Wang, F., Zhao, D., & Shen, D. (2021). The Deformation Behavior and Bending Emissions of ZnO Microwire Affected by Deformation-Induced Defects and Thermal Tunneling Effect. Sensors, 21(17), 5887. https://doi.org/10.3390/s21175887