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Journal: SensorsVolume: 21Number: 5830
Article: Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems
- Authors:
- Francisco Arellano-Espitia1,*,
- Miguel Delgado-Prieto1 and
- Artvin-Darien Gonzalez-Abreu2
- et al.
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